The development of microelectronics and IT technology makes large and ultra large integrated circuits, microprocessors, etc., widely used, especially digital logic circuits. When the logic function implemented by a digital circuit or system is different from the logic function implemented by a fault-free circuit or system, it indicates that the circuit or system has failed.
The failure of digital circuits or systems can generally be divided into physical failures and logical failures. Physical failure due to disconnected or short-circuited internal wiring or defective circuit components. The internal control logic of the digital circuit and digital system is incorrect, which is called a logic failure. Among these faults, the faults that do not change with time are called fixed faults or permanent faults; the faults that appear from time to time are called intermittent faults. The fault diagnosis of digital circuits and digital systems is mostly limited to fixed logic faults. In order to do fault detection and fault location, and then eliminate the fault, to ensure that the digital circuit and system work properly, it is necessary to test the digital circuit and system to verify the working status of the circuit and system. To diagnose digital circuit faults, special instruments must be used to solve them. A logic analyzer is one of the most powerful tools. It has sufficient input channels, advanced observation capabilities, multiple trigger modes, storage capabilities, multi-function display modes, and comparisons. Function and other capabilities.
Determine whether there is a fault in the digital circuit and system, and then determine the location of the fault, provide the necessary information to eliminate hardware and software faults, improve system performance, and ensure the reliability of the circuit and system-this type of test is called data domain test It is different from frequency domain test, time domain test, modulation domain test and statistical domain test. Data domain test instruments can be divided into node testers, logic analyzers and development systems according to their functions. The node tester takes the node data as the test object and is used to diagnose node open circuit, short circuit and bridge faults. Typical products are logic pen and pulse pen. The logic analyzer is based on the bus concept and can test multiple nodes at the same time. Generally, it has sufficient input channels, advanced observation capabilities, multiple trigger modes, storage capabilities, multi-function display and comparison capabilities. Main occasions:
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